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    MarSurf PS10 – Surface Roughness Measurement

    MarSurf_PS_10
    Overview
    The MarSurf PS10 is the ideal system for mobile surface roughness measurement. It is compact and simple to use. It has been designed for user friend interface whihc is as easy as like using a smart phone.
     
    Key Features:
    – Large, illuminated 4.3″ TFT touch display
    – Adjustable display
    – Data backup as TXT, X3P, CSV or PDF file
    – Create complete PDF measuring records directly in the measuring instrument
    – Customized comments for the PDF measuring record can be entered directly into the MarSurf PS 10
    – Mains-independent operation: Over 1200 measurements without having to recharge the instrument
    – An all-in-one solution. Small and lightweight (approx. 500 g)
    – Instrument flexibility: removable drive unit
    31 surface parameters: offer the same range of functions as a laboratory instrument
    – Roughness standard stored within housing aids in reducing errors
    – Quick access to your frequently used functions via the Favorites list in the display
    – Automatic cutoff selection, so even non-specialists can be sure of getting the correct measuring results
     
    Technical Data
     
    Measuring principle: Stylus method
    Probe: BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit
    Measuring range mm: +/- 250 µm (up to +/- 750 µm with 3x probe arm length) applies to BFW system, 350 µm applies to PHT probe system
    Filter according to ISO/JIS: filter as per ISO 16610-21(replaced Gaussian filter as per ISO 11562), robust Gaussian filter a per ISO 16610-31
    Traversing lengths: MarSurf GD 26 / SD 26: Automatic; 0.56 mm*; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,
    Measurement up to stop, variable *Traversing length dependent on drive unit, RD 18: Automatic; 1.75 mm; 5.6 mm; 17.5 mm
    Number n of sampling length according to ISO/JIS: 1 to 50 (default: 5)
    Stylus: 2 µm
    Measuring force (N): 0.75 mN
    Surface parameters: Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

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    RIGHT SYSTEM FOR THE RIGHT APPLICATION

    Before order is placed, the application of the customer is discussed in detail. Base on our vast experience in various industries, we will offer the best and most cost effective solution for that application of the customer.

    ON TIME DELIVERY WITH BEST QUALITY ASSURED

    Complex instruments delivery may some times be long. However, we strive to ensure that we deliver the systems on time every time and with the utmost quality of the product assured!

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